Results of afm measurements performed at 2 sites on each sample How to disable afm without a tune? – rx mechanic Fits of the afm 1 -afm 2 transition temperature dependence on the
AFM map of the 6 A ˚ (a), 16 A ˚ (b), and 50 A ˚ (c) of 6T grown on the
Difference between afm and stm
Afm image for 0, 5, and 24 h at 150 °c of (a) pm6:bttt-2cl and (b
Afm images taken before (control; time=0) and after acute exposure ofRole of the defects. a) afm topography of two chains containing 6 (n6 (a) close-up afm phase images (image size = 2 × 2 μm 2 ) correspondingAfm phase (left) and height (right) images of the same area of a 60/40.
-afm images of two samples grown under slightly different conditions onA-c) afm height images (2 × 2 µm), b-d) afm phase images (2 × 2 µm Afm formed ph defl pits2d afm images of an aged as-deposit (iii) sample shown in (a) and (d.

(a), (b) afm images in height mode of dissolution features on the basal
Afm images for samples produced with 30 s (a), 120 s (b), 6 × 30 s (cAfm images with 6 μm scan length of the surfaces of the (a) control Afm images (5 × 5 μm 2 ) of the as-grown [(a) and (b)] and annealedA) tapping-mode afm height images (2 × 2 µm) for pm6, y6-bo without cn.
Afm height (a-d) and phase (e-h) images of spin coated pm6:y6:pc 70 bmAfm images of 0# (a), 2# (b), 5# (c), 8# (d), 11# (e), and 14# (f Afm really going above and beyond : r/ontariograde12sThe afm-2d characterization results and gray level images of base.

Schematic picture of the used afm measurement principle.
Afm images (a) 7 days control (b) 7 days sd (c) 7 days ld (d-fFig. s3 a) height and b) phase afm images (scan size 2 x 2 m) of pm6 Afm map of the 6 a ˚ (a), 16 a ˚ (b), and 50 a ˚ (c) of 6t grown on the(a) afm topographic image of [bm 2 im][pf 6 ] – pmma fi lm. (b) height.
Afm (2-d) morphology study after 10 min stripping time with applied prcAfm images of (a) 0.05, (b) 0.1, (c) 0.2, and (d) 0.4 wt % apo after 9 (a and b) 2d afm images of growth steps on the (012) surface of the csExperiment of section 4.3.2: stable afm configurations computed using.

Afm images at the end of the process for l = 2.0 µm and g equal to (a
Comparison of afm and other imaging and analysis protocols. .
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